Wuhan, China

Shiwen Luo

This inventor holds 1 USPTO granted patent. Top assignees: Wuhan Jingce Electronic Group Co., Ltd., Wuhan Jingli Electronic Technology Co., Ltd. Active years: 2025.


% Patents Active = 100.0

Average Co-Inventor Count = 11.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Shiwen Luo - Innovator in Chromaticity Measurement

Introduction

Shiwen Luo is a notable inventor based in Wuhan, China. He has made significant contributions to the field of display technology, particularly in the calibration of tiled LED display screens. His innovative approach has led to the development of a unique chromaticity measurement method that enhances the accuracy and convenience of display calibration.

Latest Patents

Shiwen Luo holds a patent for a "Chromaticity measurement method and device for calibration of tiled LED display screen." This invention provides a systematic approach to measuring chromaticity and spectrum information from multiple regions of a tiled LED display. The method involves imaging emergent light, beam splitting, and utilizing advanced optical devices to ensure precise calibration and correction.

Career Highlights

Throughout his career, Shiwen Luo has worked with prominent companies such as Wuhan Jingce Electronic Group Co., Ltd. and Wuhan Jingli Electronic Technology Co., Ltd. His experience in these organizations has allowed him to refine his skills and contribute to advancements in electronic technology.

Collaborations

Shiwen has collaborated with talented individuals in his field, including Luning Liu and Zengqiang Zheng. These partnerships have fostered innovation and have been instrumental in the development of his patented technologies.

Conclusion

Shiwen Luo's contributions to the field of chromaticity measurement and display technology exemplify the impact of innovative thinking in enhancing electronic devices. His work continues to influence the industry and pave the way for future advancements.

Profile summary based on public USPTO records.
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