Okazaki, Japan

Shinya Miyasaka

This inventor holds 1 USPTO granted patent and 3 published patent applications. Top assignee: Toyota Jidosha Kabushiki Kaisha. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shinya Miyasaka. Retrieved from https://idiyas.com/inventor/shinya-miyasaka

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Shinya Miyasaka and His Patent in AI Risk Classification.

Introduction

Shinya Miyasaka is an inventor associated with Okazaki, Japan. His work includes a patent for an information processing system that uses distributed ledger technology to record information related to AI risk classifications.

Latest Patents

Miyasaka is listed as an inventor on 1 patent. The patent, titled “Information Processing System,” describes a distributed network that implements a distributed ledger. The ledger stores transaction data about attribute information identifying a classification for a learned model, selected from multiple classifications concerning risks posed by AI.

Career Highlights

Miyasaka is associated with Toyota Motor Corporation, whose Japanese corporate name is Toyota Jidosha Kabushiki Kaisha. His patent reflects work at the intersection of information processing, distributed ledgers, and AI risk classification.

Collaborations

Miyasaka’s listed coworkers include Naritomo Miura and Naoki Ishihara. Their names provide context for his professional connections, though the supplied information does not specify their roles in the patent.

Conclusion

Shinya Miyasaka’s patent documents an approach to recording AI risk classification information through a distributed ledger, connecting his inventive work with Toyota Motor Corporation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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