Musashino, Japan

Shinya Mito

USPTO Granted Patents = 4 

 

Average Co-Inventor Count = 2.9

ph-index = 1

Forward Citations = 3(Granted Patents)


Location History:

  • Musashino, JP (2016 - 2019)
  • Tokyo, JP (2023)

Company Filing History:


Years Active: 2016-2025

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4 patents (USPTO):

Title: Innovations of Shinya Mito in Magnetic Flaw Detection

Introduction

Shinya Mito, an accomplished inventor based in Musashino, Japan, has contributed significantly to the field of magnetic flaw detection. With a total of three patents to his name, Mito's work focuses on innovative methods and systems for identifying abnormalities in metal structures.

Latest Patents

Mito's latest patents showcase his expertise in magnetic technology. His key inventions include a magnetic flaw detection method, a magnetic field measurement processing apparatus, and a magnetic flaw detection apparatus.

The **magnetic flaw detection method** involves a magnetization step, where a magnet is moved along a magnetic body to magnetize a specific region. Following this, a magnetic sensor is arranged to measure any magnetic flux leakage from any abnormal portion of the magnetized region, allowing for effective detection of abnormalities.

The **thinning detection system** incorporates an AC current application to electrodes on metal equipment, measuring magnetic field distributions to estimate thinning distributions in the material. This innovative approach quantifies differences between reference and actual measurements to offer insights into the structural integrity of metal equipment.

Career Highlights

Currently, Shinya Mito works at Yokogawa Electric Corporation, where he continues to develop groundbreaking solutions in magnetic detection technology. His work not only demonstrates advanced technical knowledge but also highlights his commitment to enhancing safety and reliability in various industries.

Collaborations

Mito collaborates with other esteemed professionals, such as Tetsuya Ishikawa and Kazuma Takenaka. Together, they push the boundaries of innovation, contributing to the advancement of magnetic flaw detection technologies.

Conclusion

Through his inventive spirit and dedication to research, Shinya Mito has made substantial contributions to the field of magnetic flaw detection. His patents not only address critical industrial challenges but also pave the way for future innovations in the detection and analysis of structural abnormalities.

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