The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2023
Filed:
Mar. 04, 2021
Yokogawa Electric Corporation, Tokyo, JP;
Shinya Mito, Tokyo, JP;
Kazunori Miyazawa, Tokyo, JP;
Fumitake Terao, Tokyo, JP;
Shoma Takeda, Tokyo, JP;
Shoichi Shiosaki, Tokyo, JP;
YOKOGAWA ELECTRIC CORPORATION, Tokyo, JP;
Abstract
A magnetic flaw detection method includes a magnetization step (S) of moving a magnet () in a predetermined direction (D) along a surface of an object () that is a magnetic body and subsequently removing the magnet () from the surface of the object () to magnetize a region (R) corresponding to a movement range of the magnet () on the object (), a sensor arrangement step (S) of arranging a magnetic sensor () to be capable of measuring magnetic flux leakage () generated from an abnormal portion () of the region (R) that was magnetized in the object (), and a detection step (S) of detecting an abnormality in the region (R) with the magnetic sensor () arranged by the sensor arrangement step (S).