Tokyo, Japan

Shinya Iwasawa

This inventor holds 1 USPTO granted patent. Top assignee: Japan Science and Technology Agency. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shinya Iwasawa. Retrieved from https://idiyas.com/inventor/shinya-iwasawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Shinya Iwasawa: Innovator in Luminescent Lanthanide Complexes

Introduction

Shinya Iwasawa is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of luminescent materials, particularly through his innovative work on lanthanide complexes. His research focuses on the application of these complexes in various measurement techniques.

Latest Patents

Iwasawa holds a patent for a "Fluorescent lanthadine complex." This invention presents a luminescent lanthanide complex that utilizes photo-induced electron transfer as the principle for controlling luminescence. The complex consists of a substituted 2-quinolinol that contains both a sensor group and a complex group, along with a lanthanide ion (Ln). This complex can coexist in a liquid phase with a material to be measured, allowing for the measurement of its luminescence.

Career Highlights

Shinya Iwasawa is affiliated with the Japan Science and Technology Agency, where he continues to advance his research in luminescent materials. His work has garnered attention for its potential applications in various scientific fields.

Collaborations

Iwasawa has collaborated with notable colleagues, including Kazuya Kikuchi and Tetsuo Nagano. These partnerships have contributed to the development and refinement of his innovative technologies.

Conclusion

Shinya Iwasawa's contributions to the field of luminescent lanthanide complexes highlight his role as a leading inventor in Japan. His work not only advances scientific understanding but also opens new avenues for practical applications in measurement technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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