Fuchu, Japan

Shinya Ishikawa

This inventor holds 1 USPTO granted patent. Top assignee: Olympus Medical Systems Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shinya Ishikawa. Retrieved from https://idiyas.com/inventor/shinya-ishikawa-lttib8fb

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Shinya Ishikawa: Innovator in Medical Imaging Technology

Introduction

Shinya Ishikawa is a prominent inventor based in Fuchu, Japan. He has made significant contributions to the field of medical imaging technology. His innovative work has led to the development of advanced imaging systems that enhance medical diagnostics.

Latest Patents

Ishikawa holds a patent for an image pickup unit, method of manufacturing an image pickup unit, and an endoscope. This patent describes an image pickup unit that includes an image pickup substrate, a first wiring plate bonded to the substrate, and a second wiring plate with multiple surfaces and electrodes. The design allows for improved functionality and efficiency in medical imaging applications. He has 1 patent to his name.

Career Highlights

Shinya Ishikawa is associated with Olympus Medical Systems Corporation, where he has played a crucial role in advancing medical imaging technologies. His work has been instrumental in developing systems that improve the quality of medical examinations and procedures.

Collaborations

Due to space constraints, the collaborations section will be omitted.

Conclusion

Shinya Ishikawa's contributions to medical imaging technology through his innovative patents and work at Olympus Medical Systems Corporation highlight his importance in the field. His advancements continue to impact medical diagnostics positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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