Yokohama, Japan

Shinya Echigo

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Fujitsu Corporation. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shinya Echigo. Retrieved from https://idiyas.com/inventor/shinya-echigo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Shinya Echigo: Inventor in Information Processing

Introduction

Shinya Echigo is an inventor based in Yokohama, Japan. His work includes a patented method for identifying processing elements associated with delays in application execution. He is associated with Fujitsu Corporation.

Latest Patents

Echigo is credited with 1 patent: “Processing Method, Processing Apparatus, and Recording Medium to Determine Operational State of Processing Element.” The invention collects information about an application’s processing state and the operational states of processing elements involved in its execution. When a delay is detected, the method determines whether the application’s processing state correlates with the operational state of any processing element, then identifies elements with such a correlation. This approach can help locate processing components associated with application delays.

Career Highlights

Echigo’s patent reflects work on monitoring application performance and analyzing the operational states of information-processing components. The available information associates him with Fujitsu Corporation.

Collaborations

The patent lists Youichi Ehara and Junichi Yamazaki as collaborators.

Conclusion

Shinya Echigo’s patented work focuses on using operational and processing data to identify components correlated with application delays.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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