Shintaro Fujii

Title: Shintaro Fujii and Refractive Index Distribution Generation

Introduction

Shintaro Fujii is an inventor associated with Hachioji, Japan, and Evident Corporation. His work includes an invention for generating a refractive index distribution from an image captured of a sample.

Latest Patents

Fujii is named on one patent. The invention, “Generating a Refractive Index Distribution Using a Processing-Target Image Captured of a Sample,” describes a device with a processor and memory that generates a refractive index distribution corresponding to a processing-target image.

The process uses image data and refractive index information for two different structures. It sets a refractive index for image regions corresponding to the first structure based on signal intensity, and assigns refractive index information for the second structure to a different image region. This approach connects image features with the refractive properties of the structures represented in the sample.

Career Highlights

Fujii’s listed patent reflects work on image-based processing and refractive index modeling. His professional association with Evident Corporation places this invention within the company’s technology and research activities.

Collaborations

Fujii’s listed coworkers include Yoshimasa Suzuki and Satoshi Watanabe. Their names are provided as professional collaborators, though specific roles in the patent are not stated.

Conclusion

Shintaro Fujii’s patent focuses on generating refractive index distributions from sample images, combining image-region analysis with refractive index information for different structures.