Kobe, Japan

Shinsuke Anai

This inventor holds 1 USPTO granted patent. Top assignee: Tocalo Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shinsuke Anai. Retrieved from https://idiyas.com/inventor/shinsuke-anai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Shinsuke Anai and Tungsten-Based Thermal Spray Coating

Introduction

Shinsuke Anai is an inventor associated with Kobe, Japan, and Tocalo Co., Ltd. His patent work addresses materials for thermal spray coatings, including coatings intended for components used in plasma etching devices.

Latest Patents

Anai is associated with 1 patent: “Tungsten-Based Thermal Spray Coating and Material for Thermal Spraying to Obtain It.” The invention describes a coating with tungsten as its matrix phase and oxides containing silicon and boron as a dispersed phase. It also describes a thermal-spray material containing 1–7 wt% silicon and 0.5–3 wt% boron, with the remainder consisting of tungsten and unavoidable impurities. The material can be thermally sprayed to produce the coating, which is proposed for applications such as plasma etching equipment that uses halogen gas.

Career Highlights

Anai’s listed invention focuses on developing a tungsten-based coating and a corresponding spray material for producing it. The patent describes both the coating’s composition and a method for making it through thermal spraying.

Collaborations

Anai’s listed coworkers include Kazuo Hamashima and Masashi Morisasa. His company affiliation is Tocalo Co., Ltd.

Conclusion

Shinsuke Anai’s patent work centers on a tungsten-based thermal spray coating designed for demanding plasma etching applications and on the material and process used to produce it.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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