Tokyo, Japan

Shinji Tamiya

This inventor holds 1 USPTO granted patent. Top assignee: Kabushiki Kaisha Nitoms. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shinji Tamiya. Retrieved from https://idiyas.com/inventor/shinji-tamiya

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: The Innovations of Shinji Tamiya

Introduction

Shinji Tamiya is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of adhesive technology. His innovative approach has led to the development of unique products that enhance everyday life.

Latest Patents

Shinji Tamiya holds a patent for an "Adhesive tape for cleaning with patterns printed thereon." This invention showcases his creativity and understanding of practical applications in adhesive products. The patent reflects his commitment to improving user experience through innovative design.

Career Highlights

Tamiya is associated with Kabushiki Kaisha Nitoms, a company known for its advancements in adhesive solutions. His work at Nitoms has allowed him to explore new ideas and bring them to fruition. With a focus on quality and functionality, Tamiya has established himself as a key player in the industry.

Collaborations

Throughout his career, Tamiya has collaborated with talented individuals such as Motoaki Akamatsu and Satoshi Taguchi. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Shinji Tamiya's contributions to adhesive technology exemplify the spirit of innovation. His patent and work at Kabushiki Kaisha Nitoms highlight his dedication to enhancing everyday products. Tamiya's journey as an inventor continues to inspire others in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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