Tokyo, Japan

Shinji Shindo

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Maftec Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shinji Shindo. Retrieved from https://idiyas.com/inventor/shinji-shindo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
Loading Chart...
1 patent (USPTO):Explore Patents

Title: Shinji Shindo - Innovator in Fiber Measurement Technology

Introduction: Shinji Shindo is an accomplished inventor based in Tokyo, Japan. He is currently employed at Maftec Co., Ltd., where he focuses on developing advanced technologies related to fiber measurement. Although he does not hold any granted patents, his contributions to the field are noteworthy.

Latest Patent Applications: Shinji Shindo has filed several patent applications, including the following:

- FIBER DIAMETER MEASURING DEVICE

- INORGANIC FIBER SHEET PRODUCING DEVICE

- METHOD FOR MEASURING FIBER DIAMETER

- METHOD FOR PRODUCING INORGANIC FIBER SHEET

These applications describe a fiber diameter measuring device and an inorganic fiber sheet producing device that ensure the continuous safety of fiber diameter in inorganic fiber sheets. The methods proposed allow for measuring fiber diameter not only after production but also during the production process. The fiber diameter measuring device includes a sampling section capable of sampling a predetermined amount of inorganic fiber from the entire area of the inorganic fiber sheet, along with a measuring section designed to measure the fiber diameter of the sampled inorganic fiber.

Conclusion: Shinji Shindo's innovative work in fiber measurement technology highlights his commitment to advancing the field, even in the absence of granted patents. His contributions are significant and demonstrate the potential for future developments in this area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…