Tokyo, Japan

Shinichi Yoshida

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Yamaha Robotics Co., Ltd.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shinichi Yoshida. Retrieved from https://idiyas.com/inventor/shinichi-yoshida-a7yo8uo0

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Shinichi Yoshida - Innovator in Measurement Technology

Introduction

Shinichi Yoshida is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of measurement technology, particularly in the context of electronic components. His innovative approach has led to the development of a unique measurement device that enhances the understanding of electronic component positioning.

Latest Patents

Shinichi Yoshida holds 1 patent for his invention titled "Measurement device, measurement method, and bonding system." This invention provides a measurement device that enables the estimation of the state of the underside of an electronic component mounted on a substrate. The device includes a measurement part that assesses the height of the electronic component and the substrate, allowing for accurate position information regarding the mount region of the substrate.

Career Highlights

Yoshida is associated with Yamaha Robotics Co., Ltd., where he applies his expertise in measurement technology. His work focuses on improving the efficiency and accuracy of electronic component measurements, which is crucial for advancements in robotics and automation.

Conclusion

Shinichi Yoshida's contributions to measurement technology exemplify the innovative spirit of modern inventors. His patent reflects a commitment to enhancing the precision of electronic component assessments, paving the way for future advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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