Otsu, Japan

Shinichi Oku

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Optex Co., Inc.. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shinichi Oku. Retrieved from https://idiyas.com/inventor/shinichi-oku-90azcsq7

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: The Innovations of Shinichi Oku

Introduction

Shinichi Oku is a notable inventor based in Otsu, Japan. He has made significant contributions to the field of traffic monitoring technology. His innovative approach focuses on accurately determining the number of objects present in a monitored area.

Latest Patents

Shinichi Oku holds a patent for a traffic monitoring apparatus. This invention is designed to provide accurate counts of objects in surveillance areas without being influenced by their arrangement. The apparatus includes an object information acquiring device that collects three-dimensional data related to objects in the monitored area. Additionally, it features a determining device that calculates the number of objects based on their volume or height.

Career Highlights

Shinichi Oku is associated with Optex Co., Inc., a company known for its advancements in sensor technology. His work has contributed to enhancing traffic management systems and improving safety measures in urban environments.

Collaborations

Shinichi has collaborated with notable coworkers, including Hiroyuki Ohba and Yasutaka Kawahata. Their combined expertise has furthered the development of innovative solutions in the field of traffic monitoring.

Conclusion

Shinichi Oku's contributions to traffic monitoring technology exemplify the impact of innovation in enhancing public safety. His patent reflects a commitment to improving the accuracy of surveillance systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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