Yamanashi, Japan

Shinichi Imai

This inventor holds 2 USPTO granted patents. Top assignees: Oxide Corporation, The University of Tokyo. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shinichi Imai. Retrieved from https://idiyas.com/inventor/shinichi-imai-dumkbcru

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.7

ph-index = 1


Company Filing History:


Years Active: 2025

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2 patents (USPTO):Explore Patents

Title: Shinichi Imai: Innovator in Pattern Inspection Technology

Introduction

Shinichi Imai is a notable inventor based in Yamanashi, Japan. He has made significant contributions to the field of pattern inspection technology, holding a total of 2 patents. His work focuses on enhancing the capabilities of inspection apparatuses used in various applications.

Latest Patents

Imai's latest patents include a pattern inspection apparatus and a pattern inspection method. The pattern inspection apparatus features a light source, a detector, and an inspection unit. The light source emits light toward an inspection target that consists of stacked silicon substrates. The emitted light has a wavelength band ranging from 1.2 micrometers to 5.0 micrometers. The detector is designed to detect either transmitted light or reflected light from the inspection target. The inspection unit performs pattern inspection based on the detection results obtained by the detector.

Another significant patent by Imai is a laser light source for a photoemission electron microscope. This laser light source emits coherent light and includes a first laser light source that emits continuous wave coherent light. It also features an optical resonator with a non-linear optical element. The quasi-continuous wave light source emits coherent light with a wavelength shorter than that of the continuous wave coherent light, producing a near rectangular output waveform.

Career Highlights

Throughout his career, Shinichi Imai has worked with reputable organizations, including Oxide Corporation and The University of Tokyo. His experience in these institutions has allowed him to develop innovative technologies that advance the field of pattern inspection.

Collaborations

Imai has collaborated with notable colleagues such as Shik Shin and Toshiyuki Taniuchi. These collaborations have contributed to the development of his patents and innovations.

Conclusion

Shinichi Imai is a distinguished inventor whose work in pattern inspection technology has led to significant advancements in the field. His patents reflect his commitment to innovation and excellence in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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