Shingo Ishikawa

Title: Shingo Ishikawa: Innovator in Film Thickness Measurement

Introduction

Shingo Ishikawa is a notable inventor based in Kawasaki, Japan. He has made significant contributions to the field of film thickness measurement, particularly through his innovative use of infrared technology. With a total of 2 patents to his name, Ishikawa's work has advanced the methods used in measuring polymer film thickness.

Latest Patents

Ishikawa's latest patents include two groundbreaking methods for measuring film thickness. The first patent, titled "Infrared interference type film thickness measuring method," involves applying infrared light to a polymer film with a thickness of less than 30 micrometers. The infrared light is spectroscopically separated before or after being applied to the polymer film to obtain an infrared interference fringe spectrum. By detecting the extreme points of this spectrum through processing, the thickness of the polymer film can be accurately measured.

The second patent, "Infrared multilayer film thickness measuring method and apparatus," describes a method and apparatus for measuring the thicknesses of film layers made from different synthetic resins in a composite multilayer film. This method utilizes infrared rays of sample wavelengths, equal to the infrared absorption wavelength of each film layer, along with at least one reference wavelength. By projecting these wavelengths onto the multilayer film and obtaining ratios between the amounts of infrared light transmitted, the thicknesses of the film layers can be determined through a simultaneous equation.

Career Highlights

Shingo Ishikawa is currently employed at Asahi-Dow Limited, where he continues to innovate in the field of film measurement technologies. His work has not only contributed to the advancement of measurement techniques but has also enhanced the understanding of polymer films in various applications.

Collaborations

Ishikawa has collaborated with notable colleagues, including Akitaka Yasujima and Naoyuki Shiratori. Their combined expertise has further propelled advancements in the field of infrared measurement technologies.

Conclusion

Shingo Ishikawa's contributions to the field of film thickness measurement through his innovative patents demonstrate his commitment to advancing technology. His work at Asahi-Dow Limited and collaborations with esteemed colleagues highlight the importance of teamwork in driving innovation.