KANAGAWA, Japan

Shingo Hamaguchi

This inventor holds 1 USPTO granted patent and 5 published patent applications. Top assignee: Sony Semiconductor Solutions Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shingo Hamaguchi. Retrieved from https://idiyas.com/inventor/shingo-hamaguchi-0bcvywso

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Shingo Hamaguchi: Imaging Technology Inventor

Introduction

Shingo Hamaguchi is an inventor associated with Kanagawa, Japan, and Sony Semiconductor Solutions Corporation. His patent work focuses on imaging technology and components designed to support high-quality image capture.

Latest Patents

Hamaguchi is named on 1 patent: “Imaging Element Package and Electronic Device.” The invention describes a package in which a support portion holds the cover glass that protects a semiconductor substrate’s light-receiving surface. An antireflection layer is placed between the support portion and the substrate, helping the imaging element capture images with better quality. The disclosure notes that the technology can be applied to a CMOS image sensor.

Career Highlights

Hamaguchi’s listed patent reflects work on the design of imaging-element packages and the optical structures surrounding image sensors. He is associated with Sony Semiconductor Solutions Corporation, a company focused on semiconductor technologies.

Collaborations

Takashi Miyanaga is identified as Hamaguchi’s coworker. The available information does not specify whether Miyanaga collaborated with him on the patent.

Conclusion

Shingo Hamaguchi’s patent highlights an approach to improving image capture through the packaging and antireflection design of semiconductor imaging elements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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