Location History:
- Ventura, CA (US) (2019 - 2023)
- Goleta, CA (US) (2023)
Company Filing History:
Years Active: 2019-2024
Title: **Shiladitya Sen: Innovator in Light Scattering Measurement**
Introduction
Shiladitya Sen is an accomplished inventor based in Ventura, California, known for his work in the field of light scattering measurements. With five patents to his name, Sen has made significant contributions to enhancing the accuracy and efficiency of scientific measurement tools.
Latest Patents
One of Shiladitya Sen's latest patents is an "Apparatus for measuring light scattering of a sample." This innovative device is designed to measure the light scattering characteristics of a sample. It features a display that allows users to operate the measurement instrument and access data efficiently. The apparatus includes an indicator on the enclosure's external surface, which communicates the instrument's status. It also has a sample chamber that can hold various sample cells, each differing in size and shape. A sample door is incorporated to seal the chamber, providing essential thermal insulation for the samples.
Career Highlights
Shiladitya Sen has built a successful career at Wyatt Technology Corporation, where he leverages his expertise in instrumentation and measurement technologies. His profound understanding of optical systems has led to advancements in analytical techniques used in various scientific applications.
Collaborations
During his tenure at Wyatt Technology Corporation, Sen has collaborated with several talented individuals, including coworkers David Rahmlow and Matthew Greenstreet. Together, they have worked on innovative projects that aim to enhance measurement capabilities in scientific research.
Conclusion
Shiladitya Sen exemplifies the spirit of invention and innovation in the scientific community. His work in developing advanced measurement devices positions him as a key player in the field, furthering our understanding of light scattering and its applications. Through his contributions, he continues to influence the future of scientific measurement technologies.