The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2023
Filed:
Sep. 16, 2021
Wyatt Technology, Llc, Goleta, CA (US);
Sigrid C. Kuebler, Old Orchard Beach, ME (US);
Ross E. Bryant, Cape Elizabeth, ME (US);
Shiladitya Sen, Goleta, CA (US);
Ryan Olson, Goleta, CA (US);
Nicholas Wong, Santa Barbara, CA (US);
Marco Vanella, Santa Barbara, CA (US);
Ryan Thomas, Santa Barbara, CA (US);
Patrick Tufts, Santa Barbara, CA (US);
Jared Naito, Santa Barbara, CA (US);
Wyatt Technology, LLC, Goleta, CA (US);
Abstract
The present disclosure describes an apparatus of measuring light scattering of a sample. In an embodiment, the apparatus includes (1) at least one display logically coupled to an enclosure housing a light scattering measurement instrument, where the at least one display is configured to allow for operating the instrument to acquire light scattering data from the sample and for accessing the data, (2) an indicator connected to an outside surface of the enclosure, where the indicator is configured to indicate at least one status of the instrument, (3) a sample chamber configured to accommodate at least one sample cell, where each of the at least one sample cell has a unique size and a unique shape, and (4) and a sample door connected to the enclosure, where the sample door is configured to seal the sample chamber, thereby providing thermal insulation to the sample chamber.