Kanagawa, Japan

Shiho Hanashiro

This inventor holds 1 USPTO granted patent. Top assignees: Digital Printing & Solutions Co., Ltd., Meiji University, Shinsei Printing Co., Ltd.. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shiho Hanashiro. Retrieved from https://idiyas.com/inventor/shiho-hanashiro

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Shiho Hanashiro: Innovator in Object Recognition Technology.

Introduction

Shiho Hanashiro is a notable inventor based in Kanagawa, Japan. He has made significant contributions to the field of object recognition technology. His innovative work has led to the development of a novel object recognition system that enhances the ability to specify objects accurately, even in the presence of similar items.

Latest Patents

Hanashiro holds a patent for an "Object recognition system, and object recognition method." This system is designed to estimate which registered object in a database corresponds to a target object captured in an image by a user. The technology aims to improve the accuracy of object identification, making it a valuable asset in various applications.

Career Highlights

Throughout his career, Hanashiro has worked with esteemed institutions, including Meiji University and Shinsei Printing Co., Ltd. His experience in these organizations has allowed him to refine his skills and contribute to advancements in technology.

Collaborations

Hanashiro has collaborated with notable colleagues such as Ryusuke Miyamoto and Motoki Takematsu. Their combined expertise has fostered innovation and progress in their respective fields.

Conclusion

Shiho Hanashiro's contributions to object recognition technology exemplify the impact of innovative thinking in solving complex problems. His work continues to influence advancements in this critical area of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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