Shih-Lung Ouyang

Title: Shih-Lung Ouyang: Innovator in Defect Signal Detection

Introduction

Shih-Lung Ouyang is a notable inventor based in Taipei, Taiwan. He has made significant contributions to the field of signal detection, particularly through his innovative patent. His work focuses on improving the accuracy and efficiency of detecting defect signals in various applications.

Latest Patents

Shih-Lung Ouyang holds a patent for an "Apparatus and method for detecting defect signals." This invention outlines a method that includes setting a default pit length range, inputting a data signal with multiple pits of varying lengths, and transforming the data signal into a Non-Return-to-Zero (NRZ) signal. The method counts the pit lengths and accumulates the number of pits within the default range, as well as those outside it but within corresponding ranges. A defect flag signal's logic state changes when an accumulative value reaches a specific threshold. This patent showcases his expertise in signal processing and defect detection.

Career Highlights

Shih-Lung Ouyang is associated with Tian Holdings, LLC, where he applies his skills and knowledge to advance technology in his field. His work has garnered attention for its practical applications and innovative approach to problem-solving.

Collaborations

Shih-Lung Ouyang has collaborated with talented individuals such as Yi-Lin Lai and Jay Hu. These partnerships have contributed to the development of his patent and the enhancement of signal detection technologies.

Conclusion

Shih-Lung Ouyang's contributions to the field of defect signal detection through his innovative patent highlight his role as a significant inventor. His work continues to influence advancements in technology and signal processing.