Taoyuan, Taiwan

Shih-Hung Liu

This inventor holds 1 USPTO granted patent and 3 published patent applications. Top assignee: Delta Electronics, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shih-Hung Liu. Retrieved from https://idiyas.com/inventor/shih-hung-liu-tbdmljqc

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Shih-Hung Liu and Battery Rack Failure Detection

Introduction

Shih-Hung Liu is an inventor associated with Taoyuan, Taiwan, and Delta Electronics, Inc. Her patent work includes a system for detecting potential failures in battery racks.

Latest Patents

Liu is associated with 1 patent, titled “Failure Detection Method and Failure Detection System for Battery Racks.” The invention continuously monitors voltage differences across battery racks and analyzes their statistical variation and trends. It calculates voltage trends and a voltage slope, then generates an alarm when the trend status is abnormal and the slope exceeds a specified threshold. The alarm identifies the position of a battery cell experiencing an overvoltage condition.

Career Highlights

Liu’s documented patent contribution focuses on battery monitoring and failure detection. The disclosed method is designed to identify abnormal voltage behavior and provide information that can help locate an affected battery cell.

Collaborations

Liu’s listed coworkers include Wen-Fong Huang and Jyun-Kai Chen. The patent information provided identifies Delta Electronics, Inc. as her company.

Conclusion

Shih-Hung Liu’s patent work addresses battery rack safety by combining voltage measurements, trend analysis, and targeted alarms to detect potential cell overvoltage.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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