Hsinchu, Taiwan

Shih-Duen Lin

This inventor holds 1 USPTO granted patent. Top assignee: Omnivision Technologies, Inc.. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shih-Duen Lin. Retrieved from https://idiyas.com/inventor/shih-duen-lin

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Shih-Duen Lin: Innovator in Image Sensor Technology

Introduction

Shih-Duen Lin is a prominent inventor based in Hsinchu, Taiwan. He is known for his contributions to the field of image sensor technology. With a focus on enhancing the efficiency and effectiveness of testing methods, Lin has made significant strides in the industry.

Latest Patents

Lin holds a patent for an innovative image sensor testing probe card. This probe card is designed for use in testing a wafer and includes a printed circuit board (PCB) formed with a conductor pattern. The probe head is positioned in proximity to the PCB and is made of an electrically insulating material. The design features at least one hole through the probe head, with conductive pogo pins disposed in these holes. The pogo pins connect electrically to the conductor pattern on the PCB, facilitating efficient testing of the wafer.

Career Highlights

Shih-Duen Lin is currently employed at OmniVision Technologies, Inc., where he continues to develop cutting-edge technologies in image sensors. His work has been instrumental in advancing the capabilities of testing equipment used in the semiconductor industry.

Collaborations

Lin collaborates with talented individuals such as Chih-Pin Jen and Wen-Jen Ho, who contribute to the innovative environment at OmniVision Technologies.

Conclusion

Shih-Duen Lin's contributions to image sensor technology through his patent and work at OmniVision Technologies highlight his role as a key innovator in the field. His advancements continue to influence the efficiency of testing methods in the semiconductor industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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