Santa Ana, CA, United States of America

Shih-Chia Chang

This inventor holds 1 USPTO granted patent. Top assignee: General Monitors, Inc.. Active years: 1977.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shih-Chia Chang. Retrieved from https://idiyas.com/inventor/shih-chia-chang-blsegrds

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 32(Granted Patents)


Company Filing History:


Years Active: 1977

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1 patent (USPTO):Explore Patents

Title: Shih-Chia Chang: Innovator in Hydrogen Detection Technology

Introduction

Shih-Chia Chang is a prominent inventor based in Santa Ana, California. She has made significant contributions to the field of gas detection technology, particularly with her innovative approach to hydrogen detection. Her work is vital for enhancing safety in various industrial applications.

Latest Patents

Shih-Chia Chang holds a patent for a hydrogen gas detector. This invention features a semiconductor article designed for detecting hydrogen gas in the atmosphere. The detector comprises a film of palladium deposited onto a semiconductor film of stannic oxide, which is positioned on a suitable substrate along with a resistance heating element. In some instances, the stannic oxide film is enhanced with a dopant to improve the performance of the device.

Career Highlights

Chang is currently associated with General Monitors, Inc., where she applies her expertise in developing advanced detection technologies. Her work at the company has been instrumental in creating solutions that address safety concerns related to hydrogen gas.

Collaborations

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Conclusion

Shih-Chia Chang's contributions to hydrogen detection technology exemplify her innovative spirit and commitment to safety. Her patent reflects her dedication to advancing the field and improving industrial safety standards.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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