Muroran, Japan

Shigeyuki Nitta

This inventor holds 1 USPTO granted patent. Top assignees: Eddio Corporation, Nippon Steel Corporation. Active years: 1992.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shigeyuki Nitta. Retrieved from https://idiyas.com/inventor/shigeyuki-nitta

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 1992

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1 patent (USPTO):Explore Patents

Title: Shigeyuki Nitta: Innovator in Hot Flaw Detection Technology

Introduction

Shigeyuki Nitta is a notable inventor based in Muroran, Japan. He has made significant contributions to the field of flaw detection technology, particularly with his innovative patent. His work has implications for various industries, enhancing the safety and reliability of materials.

Latest Patents

Nitta holds a patent for a "Hot flaw detector with annular injection port for injecting cooling." This invention represents a crucial advancement in the detection of flaws in materials, allowing for more efficient cooling and inspection processes.

Career Highlights

Throughout his career, Shigeyuki Nitta has worked with prominent companies, including Nippon Steel Corporation and Eddio Corporation. His experience in these organizations has provided him with a solid foundation in engineering and innovation.

Collaborations

Nitta has collaborated with notable colleagues such as Mitsuo Yoshida and Kazuyoshi Miyazawa. These partnerships have likely contributed to the development and refinement of his inventions.

Conclusion

Shigeyuki Nitta's contributions to flaw detection technology exemplify the impact of innovative thinking in engineering. His patent and career achievements highlight the importance of collaboration and expertise in advancing technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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