Sagamihara, Japan

Shigeya Kawai

This inventor holds 1 USPTO granted patent. Top assignee: Daiwa Can Company. Active years: 1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shigeya Kawai. Retrieved from https://idiyas.com/inventor/shigeya-kawai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 1999

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1 patent (USPTO):Explore Patents

Title: Shigeya Kawai: Innovator in Leakage Testing Technology

Introduction

Shigeya Kawai is a notable inventor based in Sagamihara, Japan. He has made significant contributions to the field of leakage testing technology. His innovative approach has led to the development of a unique apparatus designed to detect leaks in hollow members.

Latest Patents

Kawai holds a patent for an "Apparatus for and method of testing leakage of hollow member." This invention includes a hold mechanism that isolates the inside and outside of a hollow member gas-tight. It also features an injection mechanism for introducing a testing gas into the hollow member. Additionally, a leakage detector is employed to analyze the concentration of the testing gas in the surrounding area, thereby identifying any leaks.

Career Highlights

Shigeya Kawai is associated with Daiwa Can Company, where he applies his expertise in developing innovative testing solutions. His work has been instrumental in enhancing the reliability of products that require stringent leakage testing.

Collaborations

Kawai collaborates with Tsuyoshi Yoshioka, contributing to advancements in their field through shared knowledge and expertise.

Conclusion

Shigeya Kawai's contributions to leakage testing technology exemplify the impact of innovation in engineering. His patent and work at Daiwa Can Company highlight the importance of reliable testing methods in various industries.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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