Company Filing History:
4 out of 4 
2 out of 1,037 
1 out of 1 Years Active: 1991-1997
Title: Shigesumi Kuwashima: Innovator in Image Measurement Technology
Introduction
Shigesumi Kuwashima is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of image measurement technology, holding a total of 4 patents. His work focuses on adaptive learning methods that enhance image recognition and measurement processes.
Latest Patents
Kuwashima's latest patents include innovative methods for adaptive learning type general purpose image measurement. One of his patents describes a method that involves extracting a large number of basic initial features that are invariant to parallel displacement of an object within an image frame. This method also emphasizes the additivity of these features concerning the image frame. Furthermore, it incorporates statistical feature extraction with a learning function based on multivariate analysis, allowing for adaptive use across various measurement types. Another patent outlines an apparatus designed for adaptive learning type general purpose image measurement, which includes a pick-up device for capturing objects in two dimensions, an image cutting-out device, and a correlating device for computing Nth order autocorrelation of the cut-out data.
Career Highlights
Throughout his career, Shigesumi Kuwashima has worked with prominent organizations, including Kabushiki Kaisha Ouyo Keisoku Kenkyusho and the Agency of Industrial Science and Technology. His experience in these institutions has contributed to his expertise in image measurement technologies.
Collaborations
Kuwashima has collaborated with notable individuals in his field, including Nobuyuki Otsu and Takio Kurita. These partnerships have likely enriched his research and development efforts.
Conclusion
Shigesumi Kuwashima's innovative work in image measurement technology showcases his dedication to advancing this field. His patents reflect a deep understanding of adaptive learning methods, which have the potential to significantly impact various applications in image recognition and measurement.