The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 1997
Filed:
Dec. 05, 1994
Applicant:
Inventors:
Assignees:
Agency of Industrial Science and Technology, Tokyo, JP;
Kabushiki Kaisha Ouyo Keisoku Kenkyusho, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382160 ; 382228 ;
Abstract
An adaptive learning type general purpose image measurement and recognition method includes the steps of extracting a large number of basic initial features having values which are invariant to parallel displacement of an object to be caught in an image frame and which have additivity with respect to the image frame and performing statistical feature extraction having a learning function on the basis of a multivariate analysis method applied to the extracted initial features to thereby adaptively enable use for various types of measurement.