Hadano, Japan

Shigeru Kaneko

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi, Ltd.. Active years: 1987.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shigeru Kaneko. Retrieved from https://idiyas.com/inventor/shigeru-kaneko-g79dijjl

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 16(Granted Patents)


Company Filing History:


Years Active: 1987

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1 patent (USPTO):Explore Patents

Title: Shigeru Kaneko: Innovator in Error Correction Technology.

Introduction

Shigeru Kaneko is a notable inventor based in Hadano, Japan. He has made significant contributions to the field of error correction technology. His innovative methods have paved the way for advancements in data integrity and reliability.

Latest Patents

Kaneko holds a patent for a "Method for correcting and detecting errors." This method utilizes the SEC-DED-SbED code to correct and detect errors in information encoded in several blocks of b bits. The encoding process is based on a parity matrix that includes a b.times.b matrix, where each row is cyclically displaced along the column direction by a desired number of bits. This innovative approach enhances the accuracy of data transmission and storage.

Career Highlights

Throughout his career, Kaneko has been associated with Hitachi, Ltd., a leading technology company. His work has focused on developing solutions that improve data processing and error correction mechanisms. His expertise in this area has made him a valuable asset to his organization.

Collaborations

Kaneko has collaborated with notable colleagues such as Hiroshi Kosuge and Yoshio Kiriu. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Shigeru Kaneko's contributions to error correction technology exemplify the impact of innovative thinking in the tech industry. His patent and collaborative efforts continue to influence advancements in data integrity.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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