Kanagawa, Japan

Shigeru Izawa

This inventor holds 1 USPTO granted patent. Top assignee: Kabushiki Kaisha Csk. Active years: 1991.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shigeru Izawa. Retrieved from https://idiyas.com/inventor/shigeru-izawa-suvig8ur

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 1991

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1 patent (USPTO):Explore Patents

Title: Shigeru Izawa: Innovator in Optical Recording Technology

Introduction

Shigeru Izawa is a notable inventor based in Kanagawa, Japan. He has made significant contributions to the field of optical recording technology. His work focuses on systems designed to inspect defects in optical recording mediums.

Latest Patents

Shigeru Izawa holds one patent related to his innovative work. The patent is titled "Systems for inspecting defects in an optical recording medium." This invention showcases his expertise in enhancing the quality and reliability of optical media.

Career Highlights

Izawa is associated with Kabushiki Kaisha CSK, a company known for its advancements in technology and software solutions. His role at the company has allowed him to contribute to various projects that push the boundaries of optical recording technology.

Collaborations

Throughout his career, Shigeru Izawa has collaborated with talented individuals such as Koichi Sugimura and Fumio Kimura. These collaborations have fostered innovation and have led to the development of cutting-edge technologies in their field.

Conclusion

Shigeru Izawa's contributions to optical recording technology highlight his role as an influential inventor. His patent and collaborations reflect his commitment to advancing technology in this area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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