Sanda, Japan

Shigeru Aoyama

This inventor holds 1 USPTO granted patent. Top assignee: Furuno Electric Company Limited. Active years: 1993.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shigeru Aoyama. Retrieved from https://idiyas.com/inventor/shigeru-aoyama-uwdkhb8f

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 1993

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1 patent (USPTO):Explore Patents

Title: Shigeru Aoyama: Innovator in Velocity Measurement Technology.

Introduction

Shigeru Aoyama is a notable inventor based in Sanda, Japan. He has made significant contributions to the field of measurement technology. His work primarily focuses on the development of innovative devices that enhance the accuracy and efficiency of measuring moving bodies.

Latest Patents

Aoyama holds a patent for an "Apparatus for measuring the velocity of a moving body." This invention showcases his expertise in creating advanced measurement solutions. The patent reflects his commitment to improving technology in this specialized area.

Career Highlights

Shigeru Aoyama is associated with Furuno Electric Company Limited, a company renowned for its technological advancements in marine electronics and other fields. His role at Furuno has allowed him to contribute to various projects that push the boundaries of measurement technology.

Collaborations

Aoyama has worked alongside talented colleagues such as Hiroshi Iino and Shinji Ishihara. Their collaborative efforts have fostered an environment of innovation and creativity within the company.

Conclusion

Shigeru Aoyama's contributions to measurement technology, particularly through his patent, highlight his role as an influential inventor. His work continues to inspire advancements in the field, demonstrating the importance of innovation in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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