Chiba, Japan

Shigeo Satoh

This inventor holds 1 USPTO granted patent. Top assignee: Tdk Corporation. Active years: 1993.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shigeo Satoh. Retrieved from https://idiyas.com/inventor/shigeo-satoh-oew018ow

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 1993

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1 patent (USPTO):Explore Patents

Title: Shigeo Satoh: Innovator in Magnetic Recording Technology

Introduction

Shigeo Satoh is a prominent inventor based in Chiba, Japan. He is known for his contributions to the field of magnetic recording technology. With a focus on innovation, Satoh has made significant strides in developing advanced materials for data storage.

Latest Patents

Shigeo Satoh holds a patent for a magnetic recording medium comprising a magnetic layer containing a specific formulation. This invention is crucial for enhancing the performance and reliability of magnetic storage devices. His patent portfolio includes 1 patent that showcases his expertise in this specialized area.

Career Highlights

Satoh is associated with TDK Corporation, a leading company in the electronics and data storage industry. His work at TDK has allowed him to explore and implement cutting-edge technologies in magnetic recording. His contributions have played a vital role in advancing the capabilities of storage media.

Collaborations

Throughout his career, Shigeo Satoh has collaborated with notable colleagues, including Hideharu Moro and Osamu Kohmoto. These partnerships have fostered innovation and have led to the development of new technologies in the field.

Conclusion

Shigeo Satoh's work in magnetic recording technology exemplifies the impact of innovation in data storage solutions. His contributions continue to influence the industry and pave the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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