Kodaira, Japan

Shigenobu Shirata

This inventor holds 1 USPTO granted patent. Top assignee: Kabushiki Kaisha Toshiba. Active years: 1994.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shigenobu Shirata. Retrieved from https://idiyas.com/inventor/shigenobu-shirata

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 56(Granted Patents)


Company Filing History:


Years Active: 1994

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1 patent (USPTO):Explore Patents

Title: Shigenobu Shirata: Innovator in Facility Inspection Technology

Introduction

Shigenobu Shirata is a notable inventor based in Kodaira, Japan. He has made significant contributions to the field of technology, particularly in the area of facility inspection. His innovative work has led to the development of a unique apparatus that supports facility inspections.

Latest Patents

Shigenobu Shirata holds 1 patent for his invention titled "Facility Inspection Support Apparatus." This patent showcases his commitment to enhancing the efficiency and effectiveness of facility inspections through technological advancements.

Career Highlights

Shirata is currently employed at Kabushiki Kaisha Toshiba, a leading company in the technology sector. His role at Toshiba allows him to work on cutting-edge projects that push the boundaries of innovation in facility management.

Collaborations

Throughout his career, Shigenobu Shirata has collaborated with talented individuals such as Kensuke Kawai and Miyako Negishi. These partnerships have fostered a creative environment that encourages the exchange of ideas and expertise.

Conclusion

Shigenobu Shirata's contributions to facility inspection technology exemplify the impact of innovation in improving operational processes. His work continues to inspire advancements in the field, making him a significant figure in the world of inventions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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