Company Filing History:
Years Active: 1996-1999
Title: Shigehisa Oguri: Innovator in Semiconductor Device Inspection
Introduction
Shigehisa Oguri is a prominent inventor based in Hamamatsu, Japan. He has made significant contributions to the field of semiconductor device inspection, holding a total of 2 patents. His innovative work focuses on improving the accuracy and operability of semiconductor device inspection systems.
Latest Patents
Oguri's latest patents include a semiconductor device inspection system designed to transparently capture images of the interior of semiconductor devices for the analysis of anomalous occurrences. The system utilizes infrared ray illumination to obtain image data, which is then processed to create left-to-right reversed images. This method allows for the identification of anomalies by superimposing images of weak light emitted from abnormal portions of the device. The technology enhances measurement accuracy and provides a clearer view of chip patterns, facilitating better analysis and diagnostics.
Career Highlights
Shigehisa Oguri is currently employed at Hamamatsu Photonics K.K., a company renowned for its advancements in optical technologies. His work has been instrumental in developing systems that improve the reliability and efficiency of semiconductor inspections.
Collaborations
Oguri collaborates with notable colleagues, including Eiji Inuzuka and Kouji Suzuki, who contribute to the innovative projects at Hamamatsu Photonics K.K. Their combined expertise fosters a collaborative environment that drives technological advancements in the field.
Conclusion
Shigehisa Oguri's contributions to semiconductor device inspection exemplify the impact of innovation in technology. His patents reflect a commitment to enhancing measurement techniques and improving the overall quality of semiconductor devices.