Company Filing History:
Years Active: 2011-2014
Title: Shigeaki Naito: Innovator in Electronic Device Testing
Introduction
Shigeaki Naito is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of electronic device testing, holding a total of 2 patents. His work focuses on enhancing the efficiency and effectiveness of testing integrated circuits.
Latest Patents
Naito's latest patents include a "Probe card holding apparatus with probe card engagement structure." This invention provides a mechanism to hold a probe card securely in a test head, featuring a clamp head at the center of the probe card's back surface. The holding device engages with the clamp head, ensuring stability during testing.
Another notable patent is the "Electronic device test apparatus and method of mounting of performance board in electronic device test apparatus." This apparatus is designed for testing integrated circuit devices on a wafer for electrical characteristics. It includes a test apparatus body, a probe card for electrical connection, and a prober that pushes the wafer against the probe card. The design incorporates an abutting mechanism and a lock mechanism to maintain the connection during testing.
Career Highlights
Shigeaki Naito is currently employed at Advantest Corporation, a leading company in the field of semiconductor testing. His innovative work has contributed to advancements in electronic device testing technologies, making significant impacts in the industry.
Collaborations
Naito collaborates with fellow inventor Katsuhiko Namiki, working together to push the boundaries of electronic testing technologies.
Conclusion
Shigeaki Naito's contributions to electronic device testing through his patents and work at Advantest Corporation highlight his role as a key innovator in the field. His inventions continue to influence the efficiency of testing integrated circuits, showcasing the importance of innovation in technology.