This inventor holds 1 USPTO granted patent. Top assignee: National Yang Ming Chiao Tung University. Active years: 2020.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2020
Title: Innovations of Shi-Ting Chen in Resonant Wavelength Measurement
Introduction
Shi-Ting Chen is an accomplished inventor based in Yuanshan, Taiwan. She has made significant contributions to the field of optical measurement technology. Her innovative work focuses on resonant wavelength measurement, which has applications in various scientific and industrial fields.
Latest Patents
Shi-Ting Chen holds a patent for a "Resonant Wavelength Measurement Apparatus and Measurement Method Thereof." This invention includes a light source and a measurement unit. The measurement unit features a guided-mode resonance filter and a photosensitive element. The guided-mode resonance filter contains multiple resonant areas, each with distinct filtering characteristics. This allows the apparatus to receive first light transmitted by a sensor or second light reflected by the sensor. The first light corresponds to a specific pixel on the photosensitive element, while the second light corresponds to another pixel, both relating to the same resonant wavelength. She has 1 patent to her name.
Career Highlights
Shi-Ting Chen is affiliated with National Yang Ming Chiao Tung University, where she continues her research and development in optical technologies. Her work has garnered attention for its innovative approach to wavelength measurement.
Collaborations
Shi-Ting Chen collaborates with notable colleagues, including Cheng-Sheng Huang and Chih-Wei Chang. Their combined expertise enhances the research output and innovation potential within their projects.
Conclusion
Shi-Ting Chen's contributions to resonant wavelength measurement technology exemplify her innovative spirit and dedication to advancing optical measurement methods. Her work continues to influence the field and inspire future research.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile