Nasr, Egypt

Sherif M E El-Rafei

This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sherif M E El-Rafei. Retrieved from https://idiyas.com/inventor/sherif-m-e-el-rafei

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Sherif M E El-Rafei: Innovator in Process Behavior Detection

Introduction

Sherif M E El-Rafei is a notable inventor based in Nasr, Egypt. He has made significant contributions to the field of process behavior modeling and detection. His innovative approach focuses on identifying anomalous behaviors in processes, which can have a profound impact on various industries.

Latest Patents

Sherif M E El-Rafei holds 1 patent for his invention titled "Detecting anomalous process behavior." This patent describes a method for learning a process behavior model based on past instances and one or more process attributes. Additionally, it outlines a method for detecting anomalies in processes using the corresponding behavior model.

Career Highlights

El-Rafei is currently employed at International Business Machines Corporation, commonly known as IBM. His work at IBM allows him to apply his innovative ideas in a practical setting, contributing to advancements in technology and process management.

Collaborations

Throughout his career, Sherif has collaborated with esteemed colleagues, including Ahmed K Farahat and Hany M Hassan. These collaborations have fostered a productive environment for innovation and development in their respective fields.

Conclusion

Sherif M E El-Rafei is a distinguished inventor whose work in detecting anomalous process behavior showcases his expertise and commitment to innovation. His contributions continue to influence the industry and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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