Company Filing History:
4 out of 4,296 
4 out of 527 
Years Active: 2010-2018
Title: Shenjin Ming: Innovator in X-ray Inspection Technology
Introduction
Shenjin Ming is a prominent inventor based in Beijing, China. He has made significant contributions to the field of X-ray inspection technology, holding a total of 4 patents. His work focuses on improving the efficiency and accuracy of inspection systems used in various applications.
Latest Patents
One of Shenjin Ming's latest patents is a method for measuring X-ray energy of an accelerator in an inspection system. This innovative method involves building a database that establishes a correspondence between half-value layer (HVL) and energy under predetermined conditions. It includes measuring the HVL for X-rays of the accelerator in real-time and comparing the measured HVL with the database to determine the X-ray energy of the accelerator. This method is particularly applicable to large-scale container and vehicle inspection systems, allowing for real-time acquisition of the source state of the inspection system.
Another notable patent is a detector in a scattered configuration applied to X/gamma ray container and vehicle inspection equipment. This patent discloses a detector module arranged on a detector arm, comprising multiple detector units positioned in a scattered configuration. Each unit is aimed at the beam center of a ray source, which significantly improves imaging quality while drastically reducing the size of the detector frame.
Career Highlights
Shenjin Ming has worked with esteemed institutions such as Tsinghua University and Nuctech Company Limited. His experience in these organizations has allowed him to develop and refine his innovative ideas in the field of X-ray inspection technology.
Collaborations
Shenjin has collaborated with notable colleagues, including Qitian Miao and Junli Li. Their combined expertise has contributed to advancements in the technologies they have developed together.
Conclusion
Shenjin Ming is a key figure in the realm of X-ray inspection technology, with a focus on enhancing measurement methods and detector configurations. His contributions have the potential to significantly impact the efficiency of inspection systems in various industries.
Inventor’s Patent Attorneys refers to legal professionals with specialized expertise in representing inventors throughout the patent process. These attorneys assist inventors in navigating the complexities of patent law, including filing patent applications, conducting patent searches, and protecting intellectual property rights. They play a crucial role in helping inventors secure patents for their innovative creations.