The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2018
Filed:
Dec. 18, 2015
Tsinghua University, Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Yanli Deng, Beijing, CN;
Qitian Miao, Beijing, CN;
Junli Li, Beijing, CN;
Guoping Zhu, Beijing, CN;
Weiqiang Guan, Beijing, CN;
Yuxin Hu, Beijing, CN;
Shenjin Ming, Beijing, CN;
Ming Huang, Beijing, CN;
TSINGHUA UNIVERSITY, Beijing, CN;
NUCTECH COMPANY LIMITED, Beijing, CN;
Abstract
The disclosure provides a method for measuring X-ray energy of an accelerator in an inspection system. the method comprises: building a database comprising correspondence between half-value layer (HVL) and energy under a predetermined condition; measuring HVL for X-rays of the accelerator in the inspection system on line under the same predetermined condition; and comparing the measured HVL with the HVLs in the database comprising correspondence between HVL and energy to determine the X-ray energy of the accelerator. The method is applicable to a large-scale container/vehicle inspection system for measurement of X-ray energy/HVL of the accelerator so as to acquire source state of the inspection system in real time.