Beijing, China

Shengwu Du

This inventor holds 1 USPTO granted patent. Top assignee: Tsinghua University. Active years: 2021.


% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Innovations of Shengwu Du in Laser Displacement Measurement Systems.

Introduction

Shengwu Du is a prominent inventor based in Beijing, China. He has made significant contributions to the field of laser displacement measurement systems. His innovative approach addresses critical challenges in the calibration of interferometers.

Latest Patents

Shengwu Du holds a patent titled "Method for calibrating an error of installation of an interferometer in a multi-axis laser displacement measurement system." This patent presents a method that includes adding one or more redundant interferometers to a laser interferometer displacement measurement system. The method establishes displacement calculating equations that incorporate installation errors and allows for the continuous measurement of displacement information at multiple points. By solving the equation set, the installation error of the interferometer can be accurately determined. This innovative solution enables self-calibration of the installation error without the need for additional high-precision displacement sensors.

Career Highlights

Shengwu Du is affiliated with Tsinghua University, where he contributes to research and development in advanced measurement technologies. His work has garnered attention for its practical applications in industrial settings, particularly in improving the accuracy of multi-axis interferometers.

Collaborations

He has collaborated with notable colleagues, including Yu Zhu and Jinchun Hu, to further enhance the research and development of laser measurement systems.

Conclusion

Shengwu Du's contributions to the field of laser displacement measurement systems exemplify the importance of innovation in addressing complex engineering challenges. His patented methods pave the way for advancements in precision measurement technologies.

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