Taipei, Taiwan

Sheng-Wei Wang

This inventor holds 1 USPTO granted patent. Top assignee: Morrison Optoelectronics Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sheng-Wei Wang. Retrieved from https://idiyas.com/inventor/sheng-wei-wang-alzvwrom

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Sheng-Wei Wang: Innovator in Optical Film Technology

Introduction

Sheng-Wei Wang is a notable inventor based in Taipei, Taiwan. He has made significant contributions to the field of optical film technology. His innovative work focuses on enhancing the performance of light-sensing components through advanced coating structures.

Latest Patents

Wang holds a patent for an "Anti-scattering and anti-interference coating pattern structure of an optical film." This invention features an optical film formed on a substrate, characterized by non-straight zigzag lines or multi-curved inner edge lines at the periphery. This unique design effectively reduces stray light that can affect the sensing area in light-sensing components.

Career Highlights

Sheng-Wei Wang is currently employed at Morrison Optoelectronics Ltd., where he continues to develop innovative optical solutions. His work has positioned him as a key player in the advancement of optical technologies.

Collaborations

Wang collaborates with talented colleagues, including Chin-Chen Kuo and Tsung-Hsiu Wu. Together, they contribute to the ongoing research and development efforts at their company.

Conclusion

Sheng-Wei Wang's contributions to optical film technology demonstrate his commitment to innovation and excellence in the field. His patented work is a testament to his expertise and the impact he has made in enhancing light-sensing technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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