Taoyuan, Taiwan

Sheng-Shiuan Jian

This inventor holds 1 USPTO granted patent. Top assignee: Chroma Ate Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sheng-Shiuan Jian. Retrieved from https://idiyas.com/inventor/sheng-shiuan-jian

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Sheng-Shiuan Jian and Source Measure Device Innovation.

Introduction

Sheng-Shiuan Jian is an inventor based in Taoyuan, Taiwan, associated with Chroma ATE Inc. His work includes a patented source measure device designed to monitor electrical measurements and detect abnormal voltage conditions.

Latest Patents

Jian is credited with 1 patent, titled “Source Measure Device.” The invention includes current and voltage sampling circuits that measure the current and voltage of a device under test. An overvoltage detecting circuit receives operating voltages from the sampling circuits and generates a detection voltage. A comparing circuit checks whether that voltage falls within a specified range and generates an abnormal signal if it does not.

Career Highlights

Jian’s patent reflects work on measurement equipment that combines electrical sampling with overvoltage detection. The design’s abnormal-signal function provides a way to identify when the detected voltage is outside the defined range.

Collaborations

Jian is associated with Chroma ATE Inc. His listed coworkers include Jyun-Yi Su and Ting-Ting Chang.

Conclusion

Sheng-Shiuan Jian’s source measure device patent brings together current and voltage sampling with overvoltage detection to identify abnormal operating conditions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…