Beijing, China

Sheng Jie Han

This inventor holds 1 USPTO granted patent and 3 published patent applications. Top assignee: International Business Machines Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sheng Jie Han. Retrieved from https://idiyas.com/inventor/sheng-jie-han

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Sheng Jie Han and Test-Case-Based Anomaly Detection

Introduction

Sheng Jie Han is an inventor associated with Beijing, China, and International Business Machines Corporation. His patent work addresses the use of machine learning and artificial intelligence to detect incidents during software testing.

Latest Patents

Han is associated with 1 patent: “Test Case-Based Anomaly Detection Within a Computing Environment.” The invention uses system metrics collected while test cases run to estimate the possibility of an implicit anomaly. It then applies artificial intelligence to determine whether an incident has occurred, using that anomaly assessment, and initiates an action based on the result.

Career Highlights

Han’s listed patent reflects work on applying machine learning and artificial intelligence to computing-environment monitoring and test-case analysis. The disclosed approach connects system metrics, anomaly assessment, incident detection, and responsive action.

Collaborations

The listed coworkers associated with Han include Zhi Li and Xiao Dong Li. The patent information provided identifies International Business Machines Corporation as the company associated with his work.

Conclusion

Sheng Jie Han’s patent focuses on detecting potential system anomalies and incidents during test-case execution, linking data-driven analysis with actions to support computing-environment monitoring.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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