Bengaluru, India

Shashank Jaiswal

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Nference, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shashank Jaiswal. Retrieved from https://idiyas.com/inventor/shashank-jaiswal-es99jrzg

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Shashank Jaiswal: Inventor in Machine Learning and Clinical Research.

Introduction

Shashank Jaiswal is an inventor based in Bengaluru, India. His patent work focuses on applying machine-learning methods to clinical data, particularly on expanding cohorts used to train supervised classifiers.

Latest Patents

Jaiswal is associated with 1 patent: “Apparatus and Methods for Expanding Clinical Cohorts for Improved Efficacy of Supervised Learning.” The invention describes an apparatus and method that use a labeled seed dataset to expand a clinical cohort for machine-learning applications. A processor receives the labeled seed set, trains an embedding model, and determines vector representations for both the seed data and target data. It then identifies commonalities between those representations and provides vector training data to a supervised machine-learning application for subsequent classifications.

Career Highlights

Jaiswal works at Nference, Inc. His patent reflects an approach to using relationships between seed and target data to support broader training cohorts and supervised classification.

Collaborations

Jaiswal’s coworker is Sairam Bade. The available information identifies their workplace connection but does not specify a particular joint patent or project.

Conclusion

Shashank Jaiswal’s patent centers on expanding clinical cohorts through data embeddings, with the aim of supporting supervised machine-learning classification.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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