Meerut, India

Sharad Arora

This inventor holds 1 USPTO granted patent. Top assignee: Texas Instruments Corporation. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sharad Arora. Retrieved from https://idiyas.com/inventor/sharad-arora-7xrln520

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Sharad Arora and His Integrated-Circuit Validation Patent.

Introduction

Sharad Arora is an inventor associated with Meerut, India. His work includes a patent for a design-management tool intended to support integrated-circuit validation alongside the development of individual design blocks.

Latest Patents

Arora is credited with 1 patent: “Facilitating High-Level Validation of Integrated Circuits in Parallel with Development of Blocks in a Hierarchical Design Approach.” The invention automates validation of an entire integrated circuit while its component blocks are being designed. Designers can specify checkpoints for each stage and identify the information to share with the top-level validation process. When a block reaches a checkpoint, that information becomes available for validation, helping teams assess the integrated circuit progressively and reach design closure more quickly.

Career Highlights

Arora is associated with Texas Instruments Corporation. His patent reflects an approach to coordinating hierarchical circuit design with ongoing, top-level validation.

Collaborations

The patent lists Venkatasubramanyam Visvanathan and Sivakumar Ramaiyan as collaborators.

Conclusion

Sharad Arora’s patent addresses a practical challenge in integrated-circuit development by enabling validation to proceed in parallel with the design of individual blocks.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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