New Taipei City, Taiwan

Shao-Yu Weng

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Mediatek Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shao-Yu Weng. Retrieved from https://idiyas.com/inventor/shao-yu-weng-o3uxbbt9

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Shao-Yu Weng and Blind Super-Resolution

Introduction

Shao-Yu Weng is an inventor based in New Taipei City, Taiwan. His patent work includes a method for generating high-resolution images from low-resolution images, with a focus on blind super-resolution.

Latest Patents

Weng is associated with 1 patent: “Generating a High Resolution Image from a Low Resolution Image for Blind Super-Resolution.” The method retrieves multiple patches from a low-resolution image and applies a discrete wavelet transform to each patch. This produces image patches representing different combinations of horizontal and vertical high- and low-frequency information. A dual-branch degradation extractor then derives blur and noise representations from the patches, and contrastive learning reduces the corresponding blur and noise losses.

Career Highlights

Weng works at MediaTek Corporation. His patent describes an approach to addressing blur and noise when reconstructing high-resolution images from low-resolution inputs.

Collaborations

Weng’s listed coworker is Yu-Syuan Xu. The available information identifies their professional association but does not specify the details of their collaboration.

Conclusion

Shao-Yu Weng’s patent work at MediaTek Corporation focuses on blind super-resolution, combining wavelet-based image analysis with blur and noise representation learning to generate high-resolution images.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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