Company Filing History:
Years Active: 2023-2024
Title: Innovations by Shao-Chun Chiu in Integrated Circuit Testing
Introduction
Shao-Chun Chiu is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of integrated circuit testing, holding a total of 2 patents. His work focuses on developing advanced testing devices that enhance the reliability and efficiency of integrated circuit packages.
Latest Patents
Chiu's latest patents include a "Testing device for integrated circuit package" and a "Testing device and method for integrated circuit package." The first patent describes a comprehensive testing device that consists of a printed circuit board, a testing socket, a conductive fastener, a cover, and a conductive element assembly. This innovative design allows for effective testing of integrated circuit packages by ensuring proper electrical connections and accommodating the package securely. The second patent further elaborates on a similar testing device, emphasizing the importance of multiple conductive layers and a grounded metal layer to enhance testing accuracy.
Career Highlights
Shao-Chun Chiu is currently employed at Taiwan Semiconductor Manufacturing Company Limited, a leading firm in the semiconductor industry. His role involves developing cutting-edge technologies that contribute to the advancement of integrated circuit testing methodologies. His expertise in this area has positioned him as a valuable asset to his organization.
Collaborations
Chiu has collaborated with several talented individuals in his field, including Wen-Feng Liao and Hao Chen. These collaborations have fostered innovation and have led to the development of effective solutions in integrated circuit testing.
Conclusion
Shao-Chun Chiu's contributions to integrated circuit testing through his patents and work at Taiwan Semiconductor Manufacturing Company Limited highlight his importance in the field. His innovative designs and collaborative efforts continue to push the boundaries of technology in semiconductor testing.