Hsinchu, Taiwan

Shang-Wei Wu

This inventor holds 3 USPTO granted patents. Top assignee: Mediatek Corporation. Active years: 2008-2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shang-Wei Wu. Retrieved from https://idiyas.com/inventor/shang-wei-wu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 33.3

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2008-2013

Loading Chart...
3 patents (USPTO):Explore Patents

Title: Innovations of Shang-Wei Wu

Introduction

Shang-Wei Wu is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of optical disc technology. With a total of 3 patents to his name, his work has had a considerable impact on the industry.

Latest Patents

One of his latest patents is a method for detecting whether vertical deviation of an optical disc occurs. This method involves actuating a pickup head based on an input control signal before it successfully focuses on the optical disc. The pickup head generates a focus error signal with a plurality of S-curves. By identifying the zero crossing points of these S-curves, he obtains input control values corresponding to these points. A variation of the input control values is then calculated to determine if vertical deviation of the optical disc occurs.

Career Highlights

Shang-Wei Wu is currently employed at MediaTek Corporation, where he continues to innovate in the field of optical technologies. His expertise and inventions have contributed to the advancement of optical disc detection methods.

Collaborations

He has collaborated with Hsu-Feng Ho, further enhancing the innovative capabilities within his team.

Conclusion

Shang-Wei Wu's contributions to optical disc technology through his patents and work at MediaTek Corporation highlight his role as a significant inventor in the field. His innovative methods continue to shape the future of optical technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…