Richmond, VA, United States of America

Shailendra Jain

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Capital One Services, LLC. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shailendra Jain. Retrieved from https://idiyas.com/inventor/shailendra-jain-q7o6tzx7

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Shailendra Jain: Inventor of a Machine-Learning Document Scanner

Introduction

Shailendra Jain is an inventor associated with Richmond, Virginia, and Capital One Services, LLC. His patent work describes a document-scanning system designed to identify potential problems in enterprise documents.

Latest Patents

Jain is associated with 1 patent, titled “Document scanner.” The invention describes a system that determines the scope of a document scan, accesses an enterprise document repository in read-only mode, and identifies page elements in documents within that scope. A machine-learning model analyzes those elements to detect possible problems, after which the system generates a health report for each document.

Career Highlights

Jain’s documented invention applies machine learning to document review and reporting. Its described approach combines browser-based access to an enterprise repository with automated analysis, while limiting repository access to read-only permissions.

Collaborations

Jain’s listed coworkers include Glen Rucker and David Campbell. The patent information provided identifies Capital One Services, LLC, as the company associated with his work.

Conclusion

Shailendra Jain’s “Document scanner” patent describes an approach to assessing enterprise documents with machine learning and generating reports that help identify potential issues.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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