Bnaya, Israel

Shai Kappel

This inventor holds 1 USPTO granted patent. Top assignee: Emc IP Holding Company LLC. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shai Kappel. Retrieved from https://idiyas.com/inventor/shai-kappel

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 45(Granted Patents)


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Shai Kappel - Innovator in Malware Detection

Introduction

Shai Kappel is a notable inventor based in Bnaya, Israel. He has made significant contributions to the field of cybersecurity, particularly in the detection of malware within virtual machines. His innovative approach has garnered attention in the tech community.

Latest Patents

Kappel holds a patent for a system and method of detecting malware in virtual machines. This patent involves periodically creating snapshots of the virtual machine, analyzing these snapshots against previous ones to identify anomalies, and scanning the virtual machine based on the detected anomalies. This method enhances the security of virtual environments by providing a proactive approach to malware detection.

Career Highlights

Shai Kappel is currently associated with Emc IP Holding Company LLC, where he continues to develop and refine his innovative ideas. His work focuses on improving cybersecurity measures and ensuring the integrity of virtual systems.

Collaborations

Kappel collaborates with talented individuals in his field, including Philip Derbeko and Uriya Stern. Their combined expertise contributes to the advancement of technology in malware detection.

Conclusion

Shai Kappel's contributions to malware detection in virtual machines highlight his innovative spirit and commitment to enhancing cybersecurity. His work continues to influence the industry and pave the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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