This inventor holds 1 USPTO granted patent. Top assignee: Yeda Research and Development Co. Ltd. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Shahar Seifer: Inventor in Scanning Microscopy
Introduction
Shahar Seifer is an inventor based in Rehovot, Israel. His patent work concerns computational methods for extracting structural information from scanning microscope data. He is associated with Yeda Research and Development Co. Ltd.
Latest Patents
Seifer is credited with 1 patent: “System and Method for Extraction of Structural Data of a Sample from Scan Data.” The invention describes a computer system that processes measurements from a scanning microscope to produce a structural image of a sample.
The system analyzes data from multiple detection channels and compensates for image shifts caused by off-axis channels when sample features are out of focus. This parallax correction can help separate phase and depth information and extract a depth-contrast image from a single scan dataset.
Career Highlights
Seifer’s listed patent highlights work at the intersection of microscopy, image processing, and structural analysis. The disclosed approach aims to derive depth-related information from scan measurements while addressing distortions associated with the microscope’s detection geometry.
Collaborations
The provided information lists Michael Elbaum and Lothar Houben as Seifer’s coworkers. His patent is associated with Yeda Research and Development Co. Ltd.
Conclusion
Shahar Seifer’s patent focuses on improving the extraction of structural and depth information from scanning microscope data through computational parallax correction.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile